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    • TEM Holders and Sample Preparation systems
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    • 3D Surface Metrology – Optical profilers
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Applications

  • Imaging & Characterization
    • 3D Surface Metrology – Optical profilers
    • Atomic Force & Scanning Probe Microscopy (AFM/SPM)
    • Confocal Raman Microscopy
    • Cryostats
    • In-Situ Gas/Liquid/ Heating Electron Microscopy
    • TEM Holders and Sample Preparation systems
    • Scanning Near Field Optical Microscopy (SNOM)
  • Nano Fabrication
    • 3D Surface Metrology – Optical profilers
    • TEM Holders and Sample Preparation systems
  • Particles Characterization
  • Vibrations Isolation Systems
  • Imaging & Characterization
    • 3D Surface Metrology – Optical profilers
    • Atomic Force & Scanning Probe Microscopy (AFM/SPM)
    • Confocal Raman Microscopy
    • Cryostats
    • In-Situ Gas/Liquid/ Heating Electron Microscopy
    • TEM Holders and Sample Preparation systems
    • Scanning Near Field Optical Microscopy (SNOM)
  • Nano Fabrication
    • 3D Surface Metrology – Optical profilers
    • TEM Holders and Sample Preparation systems
  • Particles Characterization
  • Vibrations Isolation Systems

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posts

  • WITec’s RISE Microscope wins prestigious Prism Award 2015
  • New line of AFM tips – OPUS™
  • Two new Supersharp BudgetSensors Probes
  • 3-D Printing with in situ Microscopy
  • Asylum Research Announces the New Cypher VRS Video-Rate AFM
  • WITec alpha300 Ri – Inverted Confocal Raman Imaging
  • AXON – Synchronicity™ Software Module
  • Asylum Research Announces the New Jupiter XR AFM
  • S wide Large Area 3D Optical Metrology System
  • AXON – Studio™ Software Module
  • WITec cryoRaman
  • VERO AFM Launch
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