19 March 2020 ||
Sensofar Metrology has announced the launch of the new metrology tool for wide area 3D optical profiling – the S wide.
The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm.
It provides the entire benefits of a digital microscope integrated into a high resolution measuring instrument. It is Extremely easy-to-use with one single button acquisition.
It gives fantastic solution for the following applications:
- Advanced manufacturing
- Archeology & Paleontology
- Consumer electronics
- Medical devices
- Molding
- Optics
- Watch industry
The system can measure roughness of 1 µm and stepheight of 2.5 µm over the entire extended area.
The system is equipped with Bi-telecentric lenses with very low field distortion providing accurate metrology. Its field of view can be as big as 34.7 X 29.1 mm2.