RISE Microscopy - Correlative Raman Imaging and Scanning Electron Microscopy (Raman-SEM)

World's first fully-integrated Raman Imaging and Scanning Electron Microscope

 

RISE Microscopy is a novel correlative microscopy technique that combines SEM and confocal Raman Imaging. Through RISE Microscopy ultra-structural surface properties can be linked to molecular compound information.

 riseThe RISE Microscope combines all features of a stand-alone SEM and the confocal Raman imaging microscope alpha300 within one instrument:

  • Quick and convenient switching between Raman and SEM measurement
  • Automated sample transfer from one measuring position to the other
  • Integrated software interface for user-friendly measurement control
  • Correlation of the measurement results and image overlay
  • No compromise in SEM and Raman imaging capabilities

RISE Key Features

Scanning Electron Microscope:

  • Fully PC-controlled SEM
  • Various electron sources: tungsten heated filament, LaB6, Schottky field emission cathode
  • Combined electron beam & focus ion beam systems available
  • High-vacuum and low-vacuum operation options
  • Unique Wide Field Optics design for a variety of working and displaying modes
  • Real-time In-Flight Beam Tracing ensures precise, direct and continuous control of the beam current and the spot size
  • Advanced 3D Beam Technology for true live stereoscopic imaging and amazing 3D experience and 3D navigation

Confocal Raman Microscope:

  • Confocal Raman Imaging with unprecedented performance in speed, sensitivity, and resolution
  • Hyperspectral image generation with the information of a complete Raman spectrum at every image pixel
  • Excellent diffraction limited lateral resolution of 200 - 300 nm
  • Outstanding depth resolution ideally suited for 3D image generation and depth profiles
  • Ultrahigh-throughput lens-based spectroscopic system for highest sensitivity and best performance in spectral resolution
  • Ultra-fast Raman imaging option with only 0.76 ms integration time per spectrum
  • Non-destructive imaging technique: no staining of fixation of the sample required

 

Diorite RISE Chemical Analysis

        Diorite (geological sample)


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