MFP-3D™ Origin AFM
The MFP-3D Origin™ is the best place to start with Atomic Force Microscopy.
The MFP-3D Origin™ marks the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family. It features the technical excellence, innovation, and world-class customer support that is the trademark of every Asylum AFM that ships out our door. With full upgrade potential to the MFP-3D and its complete range of accessories, the MFP-3D Origin is simply the best place to start with atomic force microscopy.
Why choose the MFP-3D Origin?
• The most affordable member of the MFP-3D family
• Leading closed-loop AFM resolution and performance
• Modes and accessories that empower your research
• Proven research productivity runs in the MFP-3D family
• Unmatched customer support, every step of the way
• Easily upgradable to the MFP-3D Classic for maximum versatility
What Can MFP-3D Origin Do for you?
Polymers analysis
- Morphology and nanomechanics
- Organization in blends and copolymers
- Interface / interphase properties
Thin Films measurements
- Morphology and uniformity
- Hardness and wear properties
- Electrical conductivity
- Storage and loss moduli
Electronic Devices and Other Advanced Materials
- Nanoscale failure analysis
- Data storage and magnetism
- Piezoelectric properties
- Batteries and photovoltaics
Bioscience and Biophysics
- Cell mechanics and mechanobiology
- Membranes and bilayers
- Biomolecular self-assembly
- Biomaterials and ecology
Included Modes
| • contact mode | • Phase Imaging | • Dual AC™ |
| • Lateral Force Mode (LFM) | • Loss Tangent Imaging | • Vector PFM |
| • AC Mode (Tapping Mode) | • AC Mode with Q-control | • Force Curve Mode |
| • Dual AC Resonance Tracking (DART) | • Electric Force Microscopy (EFM) | • Switching Spectroscopy PFM |
| • MicroAngelo (nanolithography/nanomanipulation) | • Piezoresponse Force Microscopy (PFM) | • Magnetic Force Microscopy (MFM) |
| • Force Mapping Mode (Force Volume) | • Kelvin Probe Force Microscopy (KPFM) |
Optional Modes
| • iDrive™ (magnetically actuated AC Mode in fluid) | • Scanning Tunneling Microscopy (STM) | • Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode |
| • Scanning Thermal Microscopy (SThM) | • Band Excitation | • Force Modulation |
| • AM-FM Viscoelastic Mapping |
