MFP-3D™ Origin AFM

The MFP-3D Origin™ is the best place to start with Atomic Force Microscopy.

The MFP-3D Origin™ marks the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family. It features the technical excellence, innovation, and world-class customer support that is the trademark of every Asylum AFM that ships out our door. With full upgrade potential to the MFP-3D and its complete range of accessories, the MFP-3D Origin is simply the best place to start with atomic force microscopy.

 

Polymer Deposits

 

Why choose the MFP-3D Origin?

 • The most affordable member of the MFP-3D family

 • Leading closed-loop AFM resolution and performance

 • Modes and accessories that empower your research

 • Proven research productivity runs in the MFP-3D family

 • Unmatched customer support, every step of the way

 • Easily upgradable to the MFP-3D Classic for maximum versatility

 

What Can MFP-3D Origin Do for you?Microgel Thin Film

Polymers analysis

  • Morphology and nanomechanics
  • Organization in blends and copolymers
  • Interface / interphase properties

 Thin Films measurements

  • Morphology and uniformity
  • Hardness and wear properties
  • Electrical conductivity
  • Storage and loss moduli

 GaFeO3Electronic Devices and Other Advanced Materials

  • Nanoscale failure analysis
  • Data storage and magnetism
  • Piezoelectric properties
  • Batteries and photovoltaics

 Bioscience and Biophysics

  •  Cell mechanics and mechanobiology
  • Membranes and bilayers
  • Biomolecular self-assembly
  • Biomaterials and ecology

 

Included Modes

• contact mode • Phase Imaging • Dual AC™
• Lateral Force Mode (LFM) • Loss Tangent Imaging • Vector PFM
• AC Mode (Tapping Mode) • AC Mode with Q-control • Force Curve Mode
• Dual AC Resonance Tracking (DART) • Electric Force Microscopy (EFM) • Switching Spectroscopy PFM
• MicroAngelo (nanolithography/nanomanipulation) • Piezoresponse Force Microscopy (PFM) • Magnetic Force Microscopy (MFM)
• Force Mapping Mode (Force Volume) • Kelvin Probe Force Microscopy (KPFM)

 

 Optional Modes

• iDrive™ (magnetically actuated AC Mode in fluid) • Scanning Tunneling Microscopy (STM) • Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
• Scanning Thermal Microscopy (SThM) • Band Excitation • Force Modulation
• AM-FM Viscoelastic Mapping  

 

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