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Imaging & Characterization

Nano Instruments Imaging & Characterization Products Line

Atomic Force/Scanning Probe Microscopes (AFM/SPM)

In-Situ Gas/Liquid/ Heating Electron Microscopy

Confocal Raman Microscopy

3D Surface Metrology - Optical profilers

Optical Photothermal IR Spectroscopy

Scanning Near Field Optical Microscopy (SNOM)

Scanning Near Field Optical Microscopy (SNOM)

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