S wide Large Area 3D Optical Metrology System

 

Sensofar Metrology has announced the launch of the new metrology tool for wide area 3D optical profiling - the S wide.S wide Large Area 3D Optical Metrology Tool

The S wide is a dedicated system designed to rapidly measure large sample areas up to 300 x 300 mm.

It provides the entire benefits of a digital microscope integrated into a high resolution measuring instrument. It is Extremely easy-to-use with one single button acquisition.

It gives fantastic solution for the following applications:Tablet Cover

  • Advanced manufacturing
  • Archeology & Paleontology
  • Consumer electronics
  • Medical devices
  • Molding
  • Optics
  • Watch industry

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Asylum Research Announces the New Jupiter XR AFM

Large Sample AFM with the Jupiter XRNew - Jupiter XR

Few atomic force microscopes (AFMs) are equipped to offer high-speed imaging on large samples (e.g. those up to 200 mm diameter). Capturing images in about a minute instead of five or even ten minutes is a tremendous boost to productivity, but most fast scanning AFMs sacrifice scan range for scan speed. Therefore, the inspectable area for a given image may only be ~30 micrometers (μm) instead of ~100 μm.

Asylum Research recently developed the Jupiter XR – the world’s first and only large-sample AFM to offer both high-speed imaging and a large 100 μm inspectable scan range – to address the growing demand for high-throughput industrial metrology measurements with sub-micrometer resolution.

Jupiter XR Large Sample AFM

Setting thei Jupter XR apart from other large-sample AFMs is a fully-addressable high-speed stage that can quickly reach any point on samples with diameters up to 200 mm. It features an extended-range scanner that is as much as 20x faster than other large-sample AFMs and features an imaging range of up to 100 μm laterally and 12 μm vertically. Images can routinely be captured in under a minute, and a fully-motorized laser and detector setup make for a simple user experience. These features make the Jupiter XR scanner the most productive and versatile large-sample AFM available.

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AXON - Synchronicity™ Software Module

AXON TEM

Protochips has announced the launch of new revolutionary TEM operation platform - the AXON.

This platform enables to Lock your sample, TEM and imaging detectors together, synchronizing system parameters and data, so you can focus on the region of interest during any in situ measurement or during any column stabilization process (due to holder insertion or accelerating voltage change). 

  • AXON Prioritize the most important parameters (magnification, ramp rate, etc.). Let the system automatically control the experiment to deliver optimal results.
  • AXON Connect and synchronize ALL experiment data in real time. More complete data sets yield faster, better results.
  • AXON Focus on your sample and not the TEM controls. Never miss a moment as you change temperature, liquid, or a gas environment even at extreme magnifications.

AXON is Compatible with the major TEM manufacturers and cameras.
Based on patent pending technology.

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WITec alpha300 Ri – Inverted Confocal Raman Imaging

alpha300Ri

Experience Raman Imaging from a new angle.

The alpha300 Ri turns 3D chemical characterization upside down. Its inverted beam path preserves all the functionality of WITec’s standard alpha300 confocal Raman imaging microscopes while introducing a new angle in access and handling. The ability to view and investigate samples from below is a great advantage when working with aqueous solutions and oversized samples. Studies in life sciences, biomedicine and geosciences in particular will benefit from the consistency and flexibility provided by the geometry of the alpha300 Ri.


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